A Scanning Tunneling Microscopic Study of Analyzing Morphology and Defects of Rhenium Diselenide Surface and Molybdenum Diselenide Surface

Tzu-Hsuan Yang^1*, Bu-Wei Huang¹, Wen-Han Chang¹, Hung-Ru Chen¹, Tsu-Yi Fu¹

¹Department of Physics, National Taiwan Normal University, Taipei, Taiwan

* Presenter:Tzu-Hsuan Yang, email:shannonyang8899@gmail.com

Rhenium diselenide and Molybdenum diselenide belong to the family of layered transition metal dichalcogenide semiconductors with layers bound by van der Waals forces. In this work, we compare the bulk surface of Rhenium diselenide and Molybdenum diselenide by a scanning tunneling microscope. By analyzing different kinds of defects on different materials, we reveal how defects affect morphology in different situations.

Keywords: two-dimensional materials, atomic and nanoscale characterization, Rhenium diselenide, suface and interface physics, Molybdenum diselenide