Development of laser-based photoemission spectroscopy and microscopy

Cheng-Tien Chiang^1,2,3,4*, Prabesh Bista^2,5, Chien-Fang Ding¹

¹Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, Taiwan
²Molecular Science and Technology Program, Taiwan International Graduate Program, Academia Sinica, Taipei, Taiwan
³Department of Physics, National Taiwan University, Taipei, Taiwan
⁴Department of Physics, Tamkang University, Taipei, Taiwan
⁵Department of Physics, National Central University, Taoyuan, Taiwan

* Presenter:Cheng-Tien Chiang, email:ctchiang@iams.sinica.edu.tw

Angle-resolved photoelectron spectroscopy (ARPES) and photoemission electron microscopy (PEEM) are general tools to study the electronic structure and morphology of solid surfaces. With the advanced design of commercial electron optics, both ARPES and PEEM can be performed in the momentum microscope [1-3]. Here the combination of a femtosecond laser and the time-of-flight momentum microscope will be outlined, and preliminary results will be presented. Our development can allow an efficient method to characterize ultrafast electron dynamics at surfaces and pave the way to analyze correlated electrons in solids.

[1] B. Krömker et al. and J. Kirschner, Rev. Sci. Instrum. 79, 053702 (2008).
[2] G. Schönhense et al., Rev. Sci. Instrum. 91, 123110 (2020).
[3] J. Maklar et al., Rev. Sci. Instrum. 91, 123112 (2020).

Keywords: angle-resolved photoelectron spectroscopy, photoemission electron microscopy, femtosecond laser, ultrafast electron dynamics